The new test cells have a compact struc­ture that enables up to 384 simultaneous measurements per cell, for a maximum 1536-DUT parallel test capacity in a 4-cell configuration, and uses only one-third of the floor space occupied by conventional test systems.

ACS EASY™ application uses AI to pro­cess vast amounts of test data to isolate and analyze the causes of yield degrada­tion and resolve production issues in a timely fashion.

With per-channel voltage ranges of -10 to +24V, the new card efficiently addresses the test requirements for high-voltage de­vices such as USB Power Delivery compo­nents and charger functionalities in power management ICs (PMICs).